Effect of Co additions on the MILC and the electrical characteristics of MILC Poly-Si TFT's

SID Conference Record of the International Display Research Conference

Volumn , Issue , 2002, Pages 403-405

  Yoon, Yeo Geon ^a   Kim, Min Sun ^a   Kim, Gi Bum ^a   Joo, Seung Ki ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; COBALT; CRYSTALLIZATION; ELECTRIC PROPERTIES; LEAKAGE CURRENTS; LOW TEMPERATURE EFFECTS; POLYSILICON;

METAL-INDUCED LATERAL CRYSTALLIZATION (MILC);

THIN FILM TRANSISTORS;

EID: 0036457887     PISSN: 10831312     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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