Extremely scaled fully depleted SOI CMOS

IEEE International SOI Conference

Volumn , Issue , 2002, Pages 135-136

  Fossum, J G ^a   Trivedi, V P ^a   Wu, K ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; GATES (TRANSISTOR); MOSFET DEVICES; POISSON EQUATION; SEMICONDUCTING SILICON; SILICON ON INSULATOR TECHNOLOGY; THIN FILMS;

BURIED OXIDES (BOX); SCALABILITY;

CMOS INTEGRATED CIRCUITS;

EID: 0036456565     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/soi.2002.1044449     Document Type: Conference Paper

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