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Volumn 719, Issue , 2002, Pages 73-78

Electrical characterization of laser-irradiated 4h-SiC wafer

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFUSION; ELECTRONIC PROPERTIES; LASER APPLICATIONS; SILICON CARBIDE; THERMAL CONDUCTIVITY;

EID: 0036450174     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-719-f3.2     Document Type: Conference Paper
Times cited : (3)

References (18)
  • 13
    • 0036502994 scopus 로고    scopus 로고
    • Laser doping of SiC substrates
    • I. Salama, N.R. Quick, A. Kar, "Laser Doping of SiC substrates", J. Elec. Mats. 31, 3, 200-208 (2002).
    • (2002) J. Elec. Mats. , vol.31 , Issue.3 , pp. 200-208
    • Salama, I.1    Quick, N.R.2    Kar, A.3
  • 14
    • 33646663214 scopus 로고    scopus 로고
    • Microstructural effects on electrical resistance in laser-treated silicon carbide
    • I.A. Salama, N.R. Quick, and A. Kar "Microstructural Effects on Electrical Resistance in Laser-treated Silicon Carbide" Submitted for publication in Mater. Sci. Eng. B.
    • Mater. Sci. Eng. B
    • Salama, I.A.1    Quick, N.R.2    Kar, A.3
  • 15
    • 0011987217 scopus 로고    scopus 로고
    • Edited by Ashok Kumar, Yip-Wah Chung, John J. Moore, Gary L. Doll, Kyoshi Yatsui and D.S. Misra.(TMS, Annual Meeting Proc., Warrendale, PA)
    • I.A. Salama, N.R. Quick, and A. Kar in "Surface Engineering: Science & Technology II" Edited by Ashok Kumar, Yip-Wah Chung, John J. Moore, Gary L. Doll, Kyoshi Yatsui and D.S. Misra.(TMS, Annual Meeting Proc., Warrendale, PA 2002) pp 113-124.
    • (2002) Surface Engineering: Science & Technology II , pp. 113-124
    • Salama, I.A.1    Quick, N.R.2    Kar, A.3
  • 17
    • 0003597031 scopus 로고
    • INSPEC; the Institute of Electrical Engineers, London
    • G.L. Harris "Properties of Silicon Carbide" (INSPEC; the Institute of Electrical Engineers, London, 1995) pp. 153-157.
    • (1995) Properties of Silicon Carbide , pp. 153-157
    • Harris, G.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.