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Volumn 719, Issue , 2002, Pages 73-78
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Electrical characterization of laser-irradiated 4h-SiC wafer
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
DIFFUSION;
ELECTRONIC PROPERTIES;
LASER APPLICATIONS;
SILICON CARBIDE;
THERMAL CONDUCTIVITY;
LASER FABRICATION;
SILICON WAFERS;
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EID: 0036450174
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-719-f3.2 Document Type: Conference Paper |
Times cited : (3)
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References (18)
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