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Volumn 72, Issue 10, 1998, Pages 1199-1201

Leakage current models of thin film silicon-on-insulator devices

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000872495     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121012     Document Type: Review
Times cited : (15)

References (11)
  • 4
    • 33645225398 scopus 로고
    • ASTM Standard F617 American Society Testing Materials, Philadelphia
    • ASTM Standard F617, 1988 Annual Book of ASTM Standards (American Society Testing Materials, Philadelphia, 1988).
    • (1988) 1988 Annual Book of ASTM Standards
  • 9
    • 22244489794 scopus 로고    scopus 로고
    • private communication
    • S. Hong and T. C. Lee (private communication).
    • Hong, S.1    Lee, T.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.