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0035942665
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75 GHz ECL static frequency divider using InAlAs/InGas HBTs
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May
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T. Mathew, H.-J. Kim, D. Scott, S. Jaganathan, S. Krishnan, Y. Wei, M. Urteaga, S. Long, and M.J.W. Rodwell, "75 GHz ECL static frequency divider using InAlAs/InGas HBTs," IEE Electronics Letters, vol. 37, no. 11, pp. 667-668, May 2001.
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Long, S.8
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0034443428
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A low power 72.8 GHz static frequency divider implemented in AlInAs/InGaAs HBT IC technology
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Seattle, WA, USA, Nov.
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M. Sokolich, C. Fields, B. Shi, Y.K. Brown, M. Montes, R. Martinez, A.R. Kramer, S. Thomas III, and M. Madhav, "A low power 72.8 GHz static frequency divider implemented in AlInAs/InGaAs HBT IC technology," IEEE GaAs IC Symposium Technical Digest, Seattle, WA, USA, Nov. 2000, pp. 81-84.
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Sokolich, M.1
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Kramer, A.R.7
Thomas S. III8
Madhav, M.9
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3
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0035163916
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5.3-ps ECL and 71-GHz static frequency divider in self-aligned SEG SiGe HBT
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Minneapolis, MN, USA, Sept.
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E. Ohue, R. Hayami, K. Oda, H. Shimamoto, and K. Washio, "5.3-ps ECL and 71-GHz Static Frequency Divider in Self-Aligned SEG SiGe HBT," Procceedings of the IEEE Bipolar Circuits and Technology Meeting, Minneapolis, MN, USA, Sept. 2001, pp. 26-29.
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Procceedings of the IEEE Bipolar Circuits and Technology Meeting
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Ohue, E.1
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4
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0034831823
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67-GHz static frequency divider using 0.2-μm self-aligned SiGe HBTs
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Jan.
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K. Washio, R. Hayami, E. Ohue, K. Oda, M. Tanabe, H. Shimamoto, and M. Kondo, "67-GHz Static Frequency Divider Using 0.2-μm Self-Aligned SiGe HBTs," IEEE Transactions on Microwave Theory and Techniques, vol. 49, no. 1, pp. 3-8, Jan. 2001.
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IEEE Transactions on Microwave Theory and Techniques
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0030213937
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Design considerations for very-high-speed Si-bipolar IC's operating up to 50 Gb/s
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Rein, H.-M.1
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6
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0035716673
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High-speed SiGe:C bipolar technology
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Washington, DC, USA, Dec.
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J. Böck, H. Schäfer, H. Knapp, D. Zöschg, K. Aufinger, M. Wurzer, S. Boguth, R. Stengl, R. Schreiter, and T.F. Meister, "High-Speed SiGe:C Bipolar Technology," IEEE International Electron Devices Meeting Technical Digest, Washington, DC, USA, Dec. 2001, pp. 344-347.
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IEEE International Electron Devices Meeting Technical Digest
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Böck, J.1
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