Study of the ESD behavior of different clamp configurations in a 0.35 μm CMOS technology

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1997, Pages 240-245

  Richier, C ^a   Maene, N ^a   Mabboux, G ^a   Bellens, R ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC CURRENT MEASUREMENT; ELECTRIC DISCHARGES; ELECTROSTATICS; GATES (TRANSISTOR); LIGHT EMISSION; MATHEMATICAL MODELS; ZENER DIODES;

CHARGED DEVICE MODELS (CDM); ELECTROSTATIC DISCHARGES (ESD); HUMAN BODY MODEL (HBM); TRANSMISSION LINE MEASUREMENTS (TLM);

CMOS INTEGRATED CIRCUITS;

EID: 0031377817     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)