Microscale temperature measurement by scanning thermal microscopy

Journal of Thermal Analysis and Calorimetry

Volumn 69, Issue 3, 2002, Pages 727-737

  Nakabeppu, O ^a   Suzuki, T ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CATALYSIS; CERAMIC MATERIALS; COMPOSITE MATERIALS; HEAT LOSSES; MICROSCOPIC EXAMINATION; REFLECTION; TEMPERATURE MEASUREMENT; THERMAL CONDUCTIVITY;

MICROSCALE TEMPERATURE MEASUREMENT; SCANNING THERMAL MICROSCOPY; THERMAL FEEDBACK;

THERMOANALYSIS;

EID: 0036402853     PISSN: 14182874     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1020683217466     Document Type: Article

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