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Volumn , Issue , 2002, Pages 382-387

Impact of scaling on the effectiveness of dynamic power reduction schemes

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER ARCHITECTURE; ELECTRIC POWER SUPPLIES TO APPARATUS; INTEGRATED CIRCUIT LAYOUT; SHORT CIRCUIT CURRENTS; THRESHOLD VOLTAGE; VOLTAGE CONTROL;

EID: 0036396948     PISSN: 10636404     EISSN: None     Source Type: Journal    
DOI: 10.1109/ICCD.2002.1106798     Document Type: Article
Times cited : (41)

References (11)
  • 1
    • 0003962275 scopus 로고    scopus 로고
    • CMOS technology scaling and its impact on cache delay
    • PhD. Thesis, Stanford University, June
    • Mc. Farland, G., "CMOS Technology Scaling and Its Impact on Cache Delay", PhD. Thesis, Stanford University, June 1997, http://umunhum.stanford.edu/˜farland/.
    • (1997)
    • McFarland, G.1
  • 3
    • 0032592096 scopus 로고    scopus 로고
    • Design challenges of technology scaling
    • July-August
    • Borkar, S., "Design Challenges of Technology Scaling", IEEE Micro, July-August 1999, pp. 23-29.
    • (1999) IEEE Micro , pp. 23-29
    • Borkar, S.1
  • 4
    • 0034842158 scopus 로고    scopus 로고
    • Future performance challenges in nanometer design
    • Sylvester, D., et al., "Future Performance Challenges in Nanometer Design", Proc. of the 38th DAC, pp. 3-8.
    • Proc. of the 38th DAC , pp. 3-8
    • Sylvester, D.1
  • 6
    • 0010944367 scopus 로고    scopus 로고
    • Clock network and phase-locked loop power estimation and experimentation
    • PhD. Thesis, Penn State University, May
    • Duarte D., "Clock Network and Phase-Locked Loop Power Estimation and Experimentation", PhD. Thesis, Penn State University, May 2002.
    • (2002)
    • Duarte, D.1
  • 7
    • 85013617709 scopus 로고    scopus 로고
    • ITRS Roadmap
    • ITRS Roadmap, http://public.itrs.net.
  • 10
    • 24544432806 scopus 로고    scopus 로고
    • Intel announces breakthrough in chip transistor design
    • Intel Corporation
    • Intel Corporation, "Intel Announces Breakthrough In Chip Transistor Design", http://www.intel.com/pressroom/archieve/releases/20011126tech.htm.
  • 11
    • 0030387118 scopus 로고    scopus 로고
    • Gate oxide scaling limits and projection
    • Hu, C., "Gate Oxide Scaling Limits and Projection", IEDM, 1996, pp. 319-322.
    • (1996) IEDM , pp. 319-322
    • Hu, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.