High-energy characterization of multilayers for hard x-ray astronomy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4496, Issue , 2002, Pages 134-139

  Ivan, Adrian ^a   Bruni, Ricardo J ^b   Cenko, Stephen B ^b,c   Gorenstein, Paul ^b   Romaine, Suzanne E ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b SMITHSONIAN ASTROPHYSICAL OBSERVATORY   (United States)

^c HARVARD UNIVERSITY   (United States)

Author keywords

Hard x ray telescopes; High energy x ray reflectivity; X ray multilayers

Indexed keywords

ASTRONOMY; CARBON; ELECTROMAGNETIC WAVE REFLECTION; OPTICAL COATINGS; OPTICAL TELESCOPES; PLATINUM; SILICON; SYNCHROTRONS; TUNGSTEN; X RAY OPTICS;

HARD X-RAY ASTRONOMY; HARD X-RAY TELESCOPES; HIGH ENERGY X-RAY REFLECTIVITY; X-RAY MULTILAYERS;

OPTICAL MULTILAYERS;

EID: 0036396888     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.454366     Document Type: Article

References (8)

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2. A. Ivan, R.J. Bruni, K. Byun, P. Gorenstein, S.E. Romaine, "Hard X-ray multilayers: a study of different material systems", Proc. SPIE, 2000.
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