Hard X-ray characterization of a HEFT single reflection prototype

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4012, Issue , 2000, Pages 626-628

  Christensen, Finn E ^a   Craig, William W ^a   Hailey, Charles J ^a   Jimenez Garate, Mario A ^a   Windt, David L ^a   Harrison, Fiona A ^a   Mao, Peter H ^a   Ziegler, Eric ^a   Honkimaki, Veijo ^a   Del Rio, Manuel S ^a   Freund, Andreas K ^a   Ohler, Michael ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ASTROPHYSICS; BAND STRUCTURE; LIGHT REFLECTION; OPTICAL COATINGS; OPTICAL MULTILAYERS; SPACE OPTICS; SYNCHROTRON RADIATION; X RAYS;

HARD X RAY OPTICS; HIGH ENERGY FOCUSING TELESCOPE (HEFT); SINGLE REFLECTION PROTOTYPE; X RAY MULTILAYERS; X RAY REFLECTIVITY; X RAY TELESCOPES;

AIRBORNE TELESCOPES;

EID: 20244369243     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)