Scanning impedance microscopy: From impedance spectra to impedance images

Materials Research Society Symposium - Proceedings

Volumn 699, Issue , 2002, Pages 101-106

  Kalinin, Sergei V ^a   Bonnell, Dawn A ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELD EFFECTS; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; INTERFACES (MATERIALS); POLYCRYSTALLINE MATERIALS; SEMICONDUCTING BISMUTH COMPOUNDS; SEMICONDUCTING SILICON; SEMICONDUCTOR JUNCTIONS; SPECTROSCOPY; TRANSPORT PROPERTIES;

CAPACITANCE-VOLTAGE CHARACTERISTIC; IMPEDANCE SPECTROSCOPY; SCANNING IMPEDANCE MICROSCOPY; SCANNING SURFACE POTENTIAL MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0036392814     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. J. Fleig, S. Rodewald, and J. Maier, J. Appl. Phys. 87, 2372-2381 (2000).
2. S.H. Kim, J.H. Suh, J.G. Park, and Yooho Kim, Jpn. J. Appl. Phys. 39, 1788-1795 (2000).
3. A.S. Skapin, J. Jamnik, and S. Pejovnik, Solid State Ionics, 133, 129-138 (2000).
4. J.H. Hwang, K.D. Johnson, T.O. Mason, and V.P. Dravid, Appl. Phys. Lett., 76, 2621-3 (2000).
5. S. Tanaka and K. Takahashi, J. Eur. Cer. Soc. 19, 727-730 (1999).
6. Sergei V. Kalinin and Dawn A. Bonnell, Appl. Phys. Lett. 78, 1306 (2001).
7. Dawn A. Bonnell and Sergei V. Kalinin, Scanning Impedance Microscopy of Electroactive Interfaces, patent pending
8. Sergei V. Kalinin and Dawn A. Bonnell, J. Appl. Phys. 91, 832, (2002).
9. www.seas.upenn.edu/sergei2/research and www.seas.upenn.edu/bonnell
10. S.V. Kalinin, D.A. Bonnell, unpublished