Influence of defect segregation on the electrical properties of Nb-doped SrTiO3 grain boundary layer

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 4 A, 2000, Pages 1788-1795

  Kim, Seong Ho ^a   Suh, Jun Hyuk ^a   Park, Jae Gwan ^a   Kim, Yoonho ^a  

^a Korea Institute of Science and Technology   (South Korea)

Author keywords

Defect segregation; Dielectric property; Grain boundary; Impedance spectroscopy; Strontium titanate

Indexed keywords

EID: 0000206860     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.1788     Document Type: Article

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