Microcontact impedance measurements of individual highly resistive grain boundaries: General aspects and application to acceptor-doped SrTio3

Journal of Applied Physics

Volumn 87, Issue 5, 2000, Pages 2372-2381

  Fleig, J ^a   Rodewald, S ^a   Maier, J ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000719056     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372189     Document Type: Article

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