Net criticality revisited: An effective method to improve timing in physical design

Proceedings of the International Symposium on Physical Design

Volumn , Issue , 2002, Pages 155-160

  Chang, H ^a   Shragowitz, E ^a   Liu, J ^a   Youssef, H ^a   Lu, B ^a   Sutanthavibul, S ^a  

^a University of Minnesota   (United States)

Author keywords

Criticality Metrics; Net Delay Bound; Placement; Routing

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; COMPUTER AIDED DESIGN; INTEGRATED CIRCUIT LAYOUT; PROBABILITY; TIMING CIRCUITS;

NET DELAY BOUND;

VLSI CIRCUITS;

EID: 0036374222     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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