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Volumn 207, Issue 1, 2002, Pages 43-51
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Sampling effects influence heights measured with atomic force microscopy
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Author keywords
AFM; Membrane; Nyquist theorem; Protein; Resolution
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Indexed keywords
PIXELS;
RASTERIZATION;
ATOMIC FORCE;
ATOMIC FORCE MICROSCOPE;
ATOMIC-FORCE-MICROSCOPY;
DISCRETE SAMPLING;
NYQUIST THEOREM;
PIXEL SIZE;
RESOLUTION;
SAMPLING EFFECTS;
SAMPLING POINTS;
TWO-DIMENSIONAL;
ATOMIC FORCE MICROSCOPY;
ACCURACY;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CONTROLLED STUDY;
HEIGHT;
IMAGING;
MEASUREMENT;
NONHUMAN;
PARTICLE SIZE;
PRIORITY JOURNAL;
SAMPLING;
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EID: 0036365715
PISSN: 00222720
EISSN: None
Source Type: Journal
DOI: 10.1046/j.1365-2818.2002.01039.x Document Type: Article |
Times cited : (13)
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References (54)
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