Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling

Journal of Microscopy

Volumn 207, Issue 2, 2002, Pages 129-136

  Huang, Y Z ^a   Lozano Perez, S ^a   Langford, R M ^a   Titchmarsh, John M ^a   Jenkins, M L ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Austenitic alloys; Focused ion beams; Ion milling; Microanalysis; Stress corrosion cracking; Transmission electron microscopy

Indexed keywords

CRACK TIPS; FOCUSED ION BEAMS; ION BOMBARDMENT; MILLING (MACHINING); RESIDUAL STRESSES; STRESS CORROSION CRACKING;

AUSTENITIC ALLOYS; FOCUSED ION BEAM MICROMACHINING; FOCUSED ION BEAM MILLING; FOCUSED IONS BEAMS; ION MILLING; METAL ALLOYS; MICROSCOPE SPECIMENS; MICROSTRUCTURAL INFORMATION; THIN FOIL; TRANSMISSION ELECTRON;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; CORROSION; EROSION; FOIL; PRIORITY JOURNAL; SEGREGATION ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036359658     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2002.01050.x     Document Type: Article

References (12)

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