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Surface and Interface Analysis

Volumn 31, Issue 7, 2001, Pages 571-581

High-resolution analytical electron microscopy characterization of corrosion and cracking at buried interfaces

(1) Hughes, D A a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

Corrosion; Electron microscopy; Intergranular attack

Indexed keywords

CRYSTAL IMPURITIES; CRYSTAL MICROSTRUCTURE; DEGRADATION; ELECTROCHEMISTRY; GRAIN BOUNDARIES; HIGH TEMPERATURE APPLICATIONS; NICKEL ALLOYS; PHASE INTERFACES; STAINLESS STEEL; TRANSMISSION ELECTRON MICROSCOPY; WATER;

HIGH RESOLUTION ANALYTICAL ELECTRON MICROSCOPY; HIGH RESOLUTION IMAGING AND ANALYSIS; INTERGRANULAR ATTACK; WATER CHEMISTRY;

STRESS CORROSION CRACKING;

EID: 0035394793 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1084 Document Type: Article

Times cited : (64)

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