Van der Waals interaction between polymer aggregates and substrate surface analyzed by atomic force microscope (AFM)

Journal of Photopolymer Science and Technology

Volumn 15, Issue 1, 2002, Pages 127-132

  Kawai, Akira ^a   Inoue, Daisuke ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Adhesion; Atomic force microscope; Peeling; Polymer aggregate; Silane coupling treatment; Surface energy; Vacancy

Indexed keywords

HEXAMETHYLDISILAZANE; POLYMER; SILANE; UNCLASSIFIED DRUG;

ADHESION; ARTICLE; ATOMIC FORCE MICROSCOPY; MATHEMATICAL MODEL; MOLECULAR INTERACTION; POLYMERIZATION;

EID: 0036351657     PISSN: 09149244     EISSN: None     Source Type: Journal    
DOI: 10.2494/photopolymer.15.127     Document Type: Article

References (11)