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Volumn 3, Issue 3-4, 2002, Pages 657-660

Evaluation of Mechanical Properties and Strain Criterion for Realibility Design of Micromachined Polysilicon Thin Films

Author keywords

Bending strength; Polysilicon; Strain analysis; Tensile strength

Indexed keywords


EID: 0036329017     PISSN: 15651339     EISSN: None     Source Type: Journal    
DOI: 10.1515/IJNSNS.2002.3.3-4.657     Document Type: Article
Times cited : (1)

References (6)
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  • 2
    • 0033712763 scopus 로고    scopus 로고
    • Study on the fundamental design issues of microelectromechanical systems, Chinese
    • Wen, S.Z., Ding, J.N. Study on the fundamental design issues of microelectromechanical systems, Chinese, J. Mech. Eng., 36(2000)39 - 42
    • (2000) J. Mech. Eng. , vol.36 , pp. 39-42
    • Wen, S.Z.1    Ding, J.N.2
  • 3
    • 0032628017 scopus 로고    scopus 로고
    • Evaluation of mechanical materials properties by means of surface micromachined structures
    • Schweitz, J.Å., Ericson, F. Evaluation of mechanical materials properties by means of surface micromachined structures, Sensors and Actuators, A74(1999)126 -133
    • (1999) Sensors and Actuators , vol.A74 , pp. 126-133
    • Schweitz, J.Å.1    Ericson, F.2
  • 4
    • 0035927973 scopus 로고    scopus 로고
    • Specimen size effect on mechanical properties of polysilicon microcantilever beams by deflection using nanoindentation
    • Ding, J.N., Meng, Y.G., Wen, S.Z. Specimen size effect on mechanical properties of polysilicon microcantilever beams by deflection using nanoindentation, Materials Science and Engineering B, 83(2001)42 - 47
    • (2001) Materials Science and Engineering B , vol.83 , pp. 42-47
    • Ding, J.N.1    Meng, Y.G.2    Wen, S.Z.3
  • 6
    • 0033096744 scopus 로고    scopus 로고
    • Relating mechanical testing and microstructural features of polysilicon thin films
    • Jayaraman, S., Edwards, R.L., Hemker, K.J. Relating mechanical testing and microstructural features of polysilicon thin films, J. Mater. Res., 14(1999)688-697
    • (1999) J. Mater. Res. , vol.14 , pp. 688-697
    • Jayaraman, S.1    Edwards, R.L.2    Hemker, K.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.