Standardless quantitative electron-excited X-ray microanalysis by energy-dispersive spectrometry: What is its proper role?

Microscopy and Microanalysis

Volumn 4, Issue 6, 1998, Pages 585-597

  Newbury, Dale E ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Electron beam X ray microanalysis; Electron probe microanalyzer; Energy dispersive spectrometry (EDS); Quantitative X ray microanalysis; Scanning electron microscope; X ray microanalysis

Indexed keywords

EID: 0032237854     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927698980564     Document Type: Article

References (13)

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