Effect of Plasma Profile Curvature on Microwave Scattering in Reflectometry

Journal of the Physical Society of Japan

Volumn 71, Issue 5, 2002, Pages 1274-1279

  Bruskin, Leonid G ^a   Mase, Atsushi ^a,b  

^a JAPAN ATOM ENER RESEARCH INSTITUTE   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

Analytical simulation; Microwave scattering; Plasma curvature; Reflectometry

Indexed keywords

AMPLITUDE MODULATION; ARTICLE; CALCULATION; DEVICE; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; MICROWAVE RADIATION; REFLECTOMETRY; SENSITIVITY ANALYSIS;

EID: 0036302407     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.71.1274     Document Type: Article

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