Density profile measurements by AM reflectometry in TJ-II

Plasma Physics and Controlled Fusion

Volumn 43, Issue 11, 2001, Pages 1535-1545

  Estrada, T ^a   Sanchez J ^a   Van Milligen, B ^a   Cupido, L ^b   Silva, A ^b   Manso, M E ^b   Zhuravlev, V ^c  

^a LABORATORIO NACIONAL DE FUSIÓN   (Spain)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^c Nuclear Fusion Institute   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; CARRIER CONCENTRATION; DEMODULATION; DENSITY MEASUREMENT (OPTICAL); ELECTRON SCATTERING; FREQUENCIES; LIGHT POLARIZATION; OPTICAL WAVEGUIDES; OSCILLATORS (ELECTRONIC); PLASMA CONFINEMENT; PLASMAS; REFLECTOMETERS;

AMPLITUDE MODULATION REFLECTOMETRY; DENSITY PROFILE MEASUREMENT; HELICAL DEVICES; HYPER ABRUPT VARACTOR TUNED OSCILLATOR; LITHIUM BEAM; TOMSON SCATTERING;

TOKAMAK DEVICES;

EID: 0035508298     PISSN: 07413335     EISSN: None     Source Type: Journal    
DOI: 10.1088/0741-3335/43/11/308     Document Type: Article

References (14)