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Volumn 43, Issue 1, 2001, Pages
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Plasma curvature effects on microwave reflectometry fluctuation measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
GEOMETRICAL OPTICS;
MATHEMATICAL MODELS;
NUMERICAL ANALYSIS;
PLASMA DENSITY;
REFLECTOMETERS;
TOKAMAK DEVICES;
MICROWAVE REFLECTOMETRY;
PLASMA CURVATURE;
PLASMA DENSITY FLUCTUATION;
PLASMA CONFINEMENT;
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EID: 0035082634
PISSN: 07413335
EISSN: None
Source Type: Journal
DOI: 10.1088/0741-3335/43/1/101 Document Type: Article |
Times cited : (54)
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References (15)
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