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Volumn 43, Issue 1, 2001, Pages

Plasma curvature effects on microwave reflectometry fluctuation measurements

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; GEOMETRICAL OPTICS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; PLASMA DENSITY; REFLECTOMETERS; TOKAMAK DEVICES;

EID: 0035082634     PISSN: 07413335     EISSN: None     Source Type: Journal    
DOI: 10.1088/0741-3335/43/1/101     Document Type: Article
Times cited : (54)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.