SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Ultramicroscopy

Volumn 90, Issue 4, 2002, Pages 241-258

Analysis of high resolution transmission electron microscope images of crystalline-amorphous interfaces

(4) Borgardt, N I a Plikat, B a Seibt, M a Schroter W a

a UNIVERSITY OF GÖTTINGEN (Germany)

Author keywords

High resolution electron microscopy (HREM); Image simulation

Indexed keywords

AMORPHOUS MATERIALS; CRYSTALLINE MATERIALS; INTERFACES (MATERIALS); TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLINE-AMORPHOUS INTERFACES;

IMAGE ANALYSIS;

ARTICLE; ATOM; CONTRAST; CRYSTAL STRUCTURE; DENSITY; IMAGE ANALYSIS; MICROSCOPE IMAGE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036200846 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(01)00153-X Document Type: Article

Times cited : (14)

References (34)

1
- 0004204524
- R.W. Cahn, P. Haasen, E.J. Kramer (Eds.), J. Zarzycki (volume editor), VCH, Weinheim
- (1991) Materials Science and Technology , vol.9
- Gaskell, P.¹

2
- 0001653725
- K.A. Jackson, W. Schröter (Eds.), Wiley-VCH, Weinheim, New York
- (2000) Handbook of Semiconductors , vol.1 , pp. 453
- Hull, R.¹ Ourmazd, A.² Rau, W.D.³ Schwander, P.⁴ Green, M.L.⁵ Tung, R.T.⁶

3
- 0003899569
- 30 nm physical gate length CMOS transistors with 1.0 ps n-MOS and 1.7 ps p-MOS gate delays
- San Fransisco, December
- (2000) IEEE Conference On Electronic Devices and Materials
- Chau, R.¹ Kavalieros, J.² Roberds, B.³ Schenker, R.⁴ Lionberger, D.⁵ Barlage, D.⁶ Doyle, B.⁷ Arghavani, R.⁸ Murthy, A.⁹ Dewey, G.¹⁰

4
- 0001275769
- (1985) Phys. Rev. B , vol.32 , pp. 8171
- Goodnick, S.M.¹ Ferry, D.K.² Wilmsen, C.W.³ Liliental, Z.⁴ Fathy, D.⁵ Krivanek, O.L.⁶

5
- 34547477575
- (1987) Phys. Rev. Lett. , vol.59 , pp. 213
- Ourmazd, A.¹ Taylor, D.W.² Rentschler, J.A.³ Bevk, J.⁴

6
- 0000700631
- (1991) Phys. Rev. B , vol.44 , pp. 1616
- Akatsu, H.¹ Sumi, Y.² Ohdomari, I.³

7
- 0034670858
- (2000) Phys. Rev. B , vol.62 , pp. 15989
- Ikarashi, N.¹ Watanabe, K.² Miyamoto, Y.³

8
- 0033600230
- (1999) Nature , vol.399 , pp. 758
- Muller, D.A.¹ Sorsch, T.² Moccio, S.³ Baumann, F.H.⁴ Evans-Lutterodth, K.⁵ Timp, G.⁶

9
- 33751376970
- (1981) J. Phys. Chem. , vol.85 , pp. 3004
- Bursill, L.A.¹ Mallinson, L.G.² Elliot, S.R.³ Thomas, J.M.⁴

10
- 0023246405
- (1987) Ultramicroscopy , vol.21 , pp. 125
- Fan, G.Y.¹ Cowley, J.M.²

11
- 0023440035
- (1987) Optik , vol.77 , pp. 115
- Scheerschmidt, K.¹ Hillebrand, R.² Heydenreich, J.³

12
- 0026911029
- (1992) Ultramicroscopy , vol.45 , pp. 65
- Timsit, R.S.¹ Waddington, W.G.² Gallerneault, C.³

13
- 0027762473
- (1993) Ultramicroscopy , vol.52 , pp. 253
- Chevalier, J.-P.¹ Hytch, M.J.²

14
- 0027518852
- (1993) Ultramicroscopy , vol.48 , pp. 203
- Miller, M.L.¹ Ewing, R.C.²

15
- 84981379854
- (1980) J. Microsc. , vol.119 , pp. 29
- Stobbs, W.M.¹ Smith, D.J.²

16
- 0018057535
- (1978) J. Non-Cryst. Solids , vol.31 , pp. 41
- Howie, A.¹

17
- 0008678341
- (1986) J. Appl. Phys. , vol.59 , pp. 2798
- Ohdomari, I.¹ Mihara, T.² Kai, K.³

18
- 84873169285
- (1997) Bull. Russ. Acad. Sci. Phys. , vol.61 , pp. 1544
- Borgardt, N.I.¹ Plikat, B.² Seibt, M.³ Schröter, W.⁴

19
- 0008661849
- (1999) Inst. Phys. Conf. Ser. , vol.164 , pp. 43
- Plikat, B.¹ Borgardt, N.I.² Seibt, M.³ Schröter, W.⁴ Wagner, T.⁵

20
- 0008641481
- (1996) Inst. Phys. Conf. Ser. , vol.149 , pp. 301
- Suhren, M.¹ Gräf, D.² Schmolke, R.³ Piontek, H.⁴ Wagner, P.⁵

21
- 0001531213
- (1992) Appl. Phys. Lett. , vol.60 , pp. 1307
- Neuwald, U.¹ Hessel, H.E.² Feltz, A.³ Memmert, U.⁴ Behm, R.J.⁵

22
- 84945100879
- (1974) Acta Cryst. A , vol.30 , pp. 280
- Goodman, P.¹ Moodie, A.F.²

23
- 0003693959
- P. Buseck, J. Cowley, L. Eyring (Eds.), Oxford University Press, Oxford
- (1992) High-Resolution Transmission Electron Microscopy and Associated Techniques
- Cowley, J.¹

24
- 84980074290
- (1968) Acta Cryst. A , vol.24 , pp. 390
- Doyle, P.A.¹ Turner, P.S.²

25
- 0023162961
- (1987) Ultramicroscopy , vol.21 , pp. 131
- Stadelmann, P.A.¹

26
- 0031897296
- (1998) J. Microsc. , vol.190 , Issue.PARTS 1-2 , pp. 99
- Boothroyd, C.B.¹

27
- 0020123419
- (1982) J. Non-Cryst. Solids , vol.48 , pp. 265
- Etherington, G.¹ Wright, A.C.² Wenzel, J.T.³ Dore, J.C.⁴ Clarke, J.H.⁵ Sinclair, R.N.⁶

28
- 0028533856
- (1994) Ultramicroscopy , vol.56 , pp. 54
- Möbus, G.¹ Rühle, M.²

29
- 0028533814
- (1994) Ultramicroscopy , vol.56 , pp. 46
- King, W.E.¹ Campbell, G.H.²

30
- 0028401512
- (1994) Ultramicroscopy , vol.53 , pp. 205
- Hofmann, D.¹ Ernst, F.²

31
- 0030272104
- (1996) Ultramicroscopy , vol.65 , pp. 205
- Möbus, G.¹

32
- 0027109838
- (1992) Ultramicroscopy , vol.47 , pp. 223
- Lichte, H.¹

33
- 0030221970
- (1996) Ultramicroscopy , vol.64 , pp. 211
- Thust, A.¹ Coene, W.M.J.² Op de Beeck, M.³ Van Dyck, D.⁴

34
- 0025889104
- (1991) Philos. Mag. A , vol.63 , pp. 1
- Ross, F.M.¹ Stobbs, W.M.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.