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Volumn 3, Issue 1, 2002, Pages 63-68

Perspectives on single molecule diffraction using the X-ray free electron laser

Author keywords

Free electron laser; Phase determination; Radiation damage; Self amplified spontaneous emission laser (SASE); Single molecule diffraction; X ray crystallography

Indexed keywords

CELL ORGANELLE; CONTROLLED STUDY; CRYSTAL STRUCTURE; CRYSTALLIZATION; ELECTRON DIFFRACTION; FOURIER TRANSFORMATION; LASER; LIGHT SCATTERING; MACROMOLECULE; MATHEMATICAL MODEL; METHODOLOGY; OPTICAL RESOLUTION; PROCESS TECHNOLOGY; RADIATION DOSE; RADIATION INJURY; REVIEW; SAMPLING; SIGNAL DETECTION; STRUCTURE ANALYSIS; X RAY ANALYSIS;

EID: 0036111224     PISSN: 14385163     EISSN: None     Source Type: Journal    
DOI: 10.1002/1438-5171(200204)3:1<63::AID-SIMO63>3.0.CO;2-O     Document Type: Review
Times cited : (10)

References (35)
  • 22
    • 0006151642 scopus 로고
    • Soft X-ray Microscopy
    • Proc. SPIE No. 1741 edited by C. Jacobsen & J. Trebes
    • (1992) , pp. 402-408
    • Gilbert, J.R.1    Pine, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.