Characterization and modeling of small-signal substrate resistance effect in RF CMOS

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 2002, Pages 161-164

  Lin, Yo Sheng ^a   Lu, Shey Shi ^b   Lee, Tai Hsing ^a   Liang, Hsiao Bin ^a  

^a NATIONAL CHI NAN UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRIC INDUCTORS; ELECTRIC RESISTANCE; MOSFET DEVICES;

DEVICE-UNDER-TEST; KINK PHENOMENON; SHUNT-SHUNT THEORY; TRANSISTOR SCATTERING PARAMETERS;

CMOS INTEGRATED CIRCUITS;

EID: 0036073647     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MWSYM.2002.1011584     Document Type: Article

References (4)