An implication-based method to detect multi-cycle paths in large sequential circuits

Proceedings - Design Automation Conference

Volumn , Issue , 2002, Pages 164-169

  Higuchi, Hiroyuki ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

ATPG; Implication; Multi cycle path; Sequential circuits

Indexed keywords

COMBINATORIAL MATHEMATICS; DELAY CIRCUITS; LOGIC CIRCUITS; OPTIMIZATION;

MULTI-CYCLE PATH ANALYSIS;

SEQUENTIAL CIRCUITS;

EID: 0036059440     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/dac.2002.1012613     Document Type: Conference Paper

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