MODELING AND TEST POINT SELECTION FOR DATA CONVERTER TESTING.

Digest of Papers - International Test Conference

Volumn , Issue , 1985, Pages 813-817

  Souders, T M ^a   Stenbakken, G N ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING;

DATA CONVERTERS; DIGITAL-ANALOG CONVERSION; TEST POINT SELECTION;

DATA CONVERSION, DIGITAL TO ANALOG;

EID: 0022308604     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)