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Volumn 4692, Issue , 2002, Pages 195-211

Nondestructive testing of damage layers in semiconductor materials by surface acoustic waves

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; AGGLOMERATION; CRYSTALLOGRAPHY; DISPERSION (WAVES); ELASTIC MODULI; ETCHING; LASER APPLICATIONS; LASER PULSES; NONDESTRUCTIVE EXAMINATION; PIEZOELECTRIC DEVICES; POLISHING; SINGLE CRYSTALS; STIFFNESS;

EID: 0036030795     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.475660     Document Type: Article
Times cited : (10)

References (9)
  • 7
    • 84970134245 scopus 로고
    • W.P. Mason, R.N. Thurston (Eds.), Academic Press, New York
    • G.W. Farnell, E.L. Adler, in: W.P. Mason, R.N. Thurston (Eds.), Physical Acoustics., Vol. IX, Academic Press, New York, 1972, p. 35.
    • (1972) Physical Acoustics , vol.9 , pp. 35
    • Farnell, G.W.1    Adler, E.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.