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Volumn 4692, Issue , 2002, Pages 195-211
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Nondestructive testing of damage layers in semiconductor materials by surface acoustic waves
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC SURFACE WAVE DEVICES;
AGGLOMERATION;
CRYSTALLOGRAPHY;
DISPERSION (WAVES);
ELASTIC MODULI;
ETCHING;
LASER APPLICATIONS;
LASER PULSES;
NONDESTRUCTIVE EXAMINATION;
PIEZOELECTRIC DEVICES;
POLISHING;
SINGLE CRYSTALS;
STIFFNESS;
LASER-ACOUSTIC SIGNALS;
SEMICONDUCTOR MATERIALS;
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EID: 0036030795
PISSN: 0277786X
EISSN: None
Source Type: Journal
DOI: 10.1117/12.475660 Document Type: Article |
Times cited : (10)
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References (9)
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