Measurement of gain spectra, refractive index shift and linewidth enhancement factor in Al-free 980 nm lasers with broadened waveguide

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4646, Issue , 2002, Pages 344-354

  Rodriguez D ^a   Borruel, L ^a   Esquivias, I ^a   Krakowski, M ^b   Collot, P ^b  

^a UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

^b THALES RESEARCH AND TECHNOLOGY   (France)

Author keywords

Differential index; Linewidth enhancement factor; Optical gain; Quantum well laser; Semiconductor laser

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; EMISSION SPECTROSCOPY; GAIN MEASUREMENT; OPTICAL FILTERS; OPTICAL WAVEGUIDES; QUANTUM WELL LASERS; REFRACTIVE INDEX; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE STRUCTURES;

AMPLIFIED SPONTANEOUS EMISSION SPECTRA; DIFFERENTIAL REFRACTIVE INDEX; LINEWIDTH ENHANCEMENT FACTOR; OPTICAL GAIN; SOFTWARE PACKAGE HAROLD; SPATIAL FILTERING;

SEMICONDUCTOR LASERS;

EID: 0036030715     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.470534     Document Type: Article

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