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Volumn 11, Issue 11, 1999, Pages 1372-1374

Measurement of semiconductor laser gain and dispersion curves utilizing Fourier transforms of the emission spectra

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC DISPERSION; EMISSION SPECTROSCOPY; FOURIER TRANSFORMS; GAIN MEASUREMENT; REFRACTIVE INDEX; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0033221657     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.803049     Document Type: Article
Times cited : (80)

References (12)
  • 1
    • 0015667898 scopus 로고
    • CW degradation at 300K of GaAs double-heterostructure junction lasers - II: Electronic gain
    • B. W. Hakki and T. L. Paoli, "CW degradation at 300K of GaAs double-heterostructure junction lasers - II: Electronic gain," J. Appl. Phys., vol. 44, pp. 4113-4119, 1973.
    • (1973) J. Appl. Phys. , vol.44 , pp. 4113-4119
    • Hakki, B.W.1    Paoli, T.L.2
  • 2
    • 0016484178 scopus 로고
    • Gain spectra in GaAs double-heterostructure injection lasers
    • _, "Gain spectra in GaAs double-heterostructure injection lasers," J. Appl. Phys., vol. 46, pp. 1299-1305, 1975.
    • (1975) J. Appl. Phys. , vol.46 , pp. 1299-1305
  • 3
    • 0000182971 scopus 로고
    • Technique for measurement of the gain spectra of semi-conductor diode lasers
    • D. T. Cassidy, "Technique for measurement of the gain spectra of semi-conductor diode lasers," J. Appl. Phys., vol. 56, no. 11, pp. 3096-3099, 1984.
    • (1984) J. Appl. Phys. , vol.56 , Issue.11 , pp. 3096-3099
    • Cassidy, D.T.1
  • 4
    • 0019024186 scopus 로고
    • Measurement of gain and absorption spectra in AlGaAs buried heterostructure lasers
    • C. H. Henry, R. A. Logan, and F. R. Merrit, "Measurement of gain and absorption spectra in AlGaAs buried heterostructure lasers," J. Appl. Phys., vol. 51, no. 6, pp. 3042-3050, 1980.
    • (1980) J. Appl. Phys. , vol.51 , Issue.6 , pp. 3042-3050
    • Henry, C.H.1    Logan, R.A.2    Merrit, F.R.3
  • 6
    • 0032187456 scopus 로고    scopus 로고
    • Measurement of optical cavity properties in semiconductor lasers by fourier transforming their emission spectrum
    • Oct.
    • D. Hofstetter and R. L. Thornton, "Measurement of optical cavity properties in semiconductor lasers by Fourier transforming their emission spectrum," IEEE J. Quantum Electron., vol. 34, pp. 1914-1923, Oct. 1998.
    • (1998) IEEE J. Quantum Electron. , vol.34 , pp. 1914-1923
    • Hofstetter, D.1    Thornton, R.L.2
  • 10
    • 0342726163 scopus 로고
    • Cambridge, U.K.: Cambridge Univ. Press, ch. 9
    • W. H. Steel, Interferometry, 2nd ed. Cambridge, U.K.: Cambridge Univ. Press, 1983, ch. 9, pp. 141-149.
    • (1983) Interferometry, 2nd Ed. , pp. 141-149
    • Steel, W.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.