Efficient real-space multigrid method and applications to clusters and defects in SiO2

Journal of the Korean Physical Society

Volumn 40, Issue 3, 2002, Pages 406-415

  Jin, Young Gu ^a   Chang, K J ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Cluster; Defect; Electronic structure; Multigird; Real space

Indexed keywords

EID: 0036004509     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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