Interference technique in grazing-emission electron probe microanalysis of submicrometer particles

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 56, Issue 5, 2001, Pages 503-515

  Bekshaev, A ^a   Van Grieken, R ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Electron probe microanalysis; Grazing exit; Interference effect; Particle analysis; Structure investigation

Indexed keywords

ELECTRON BEAMS; ELECTRON EMISSION; ELECTRONIC STRUCTURE; FOURIER TRANSFORMS; LIGHT INTERFERENCE; MATHEMATICAL MODELS; MICROANALYSIS; PARTICLES (PARTICULATE MATTER);

GRAZING EMISSION ELECTRON PROBE MICROANALYSIS;

ELECTRON MICROSCOPY;

EID: 0035978236     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(01)00177-X     Document Type: Article

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