Stark-broadened hydrogen line profiles predicted by the model microfield method for calculating electron number densities

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 56, Issue 5, 2001, Pages 527-539

  Acon, B W ^a   Stehle C ^a   Zhang, H ^a   Montaser, A ^a  

^a GEORGE WASHINGTON UNIVERSITY   (United States)

Author keywords

Electron number density; Helium ICP; Inductively coupled plasmas; Model microfield method; Stark broadened profiles; Unified Theory

Indexed keywords

ARGON; CARRIER CONCENTRATION; HELIUM; HYDROGEN; INDUCTIVELY COUPLED PLASMA; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS;

ELECTRON NUMBER DENSITY; STARK-BROADENED PROFILES; UNIFIED THEORY;

ELECTRON MICROSCOPY;

EID: 0035978231     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(01)00201-4     Document Type: Article

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