In situ XPS investigations of ion beam hydrogenation of CuInSe2

Thin Solid Films

Volumn 387, Issue 1-2, 2001, Pages 185-188

  Otte, K ^a   Lippold, G ^a   Hirsch, D ^a   Chasse T ^a   Schindler, A ^a   Yakushev, M V ^b   Martin, R W ^b   Bigl, F ^a  

^a LEIBNIZ INSTITUTE OF SURFACE ENGINEERING IOM   (Germany)

^b UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

CuInSe2; Defects; Diffusion; Hydrogen; Implantation; XPS

Indexed keywords

HYDROGENATION; ION BEAMS; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

COPPER INDIUM SELENIDE;

COPPER COMPOUNDS;

EID: 0035967574     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01814-9     Document Type: Article

References (9)