XPS analysis of chemically treated I-III-VI semiconductor surfaces and the relation to II-VI/I-III-VI heterojunction formation

Materials Research Society Symposium - Proceedings

Volumn 426, Issue , 1996, Pages 297-302

  Nelson, A J ^a   Schwerdtfeger, C R ^a   Herdt, G C ^a   King, D ^a   Contreras, M ^a   Ramanathan, K ^a   O'Brien, W L ^a  

^a Department of Geology and Geological Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIUM COMPOUNDS; BAND STRUCTURE; COPPER COMPOUNDS; HETEROJUNCTIONS; HYDROCHLORIC ACID; MORPHOLOGY; PHOTOEMISSION; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SURFACE TREATMENT; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

COPPER INDIUM DISELENIDE THIN FILMS; SURFACE CHEMISTRY;

SEMICONDUCTING FILMS;

EID: 0030420020     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-426-297     Document Type: Conference Paper

References (9)