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Volumn 86, Issue 22, 2001, Pages 5070-5072

Controlling crystal surface termination by cleavage direction

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL SYMMETRY; INTERFACES (MATERIALS); POSITIVE IONS; SINGLE CRYSTALS; SUBSTRATES; SURFACES; X RAY CRYSTALLOGRAPHY;

EID: 0035962965     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.5070     Document Type: Article
Times cited : (15)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.