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Volumn 86, Issue 22, 2001, Pages 5070-5072
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Controlling crystal surface termination by cleavage direction
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL DEFECTS;
CRYSTAL GROWTH;
CRYSTAL SYMMETRY;
INTERFACES (MATERIALS);
POSITIVE IONS;
SINGLE CRYSTALS;
SUBSTRATES;
SURFACES;
X RAY CRYSTALLOGRAPHY;
IONIC CRYSTAL;
LATTICE TRAPPING;
POTASSIUM BICHROMATE;
SURFACE TERMINATION;
POTASSIUM COMPOUNDS;
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EID: 0035962965
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.86.5070 Document Type: Article |
Times cited : (15)
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References (20)
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