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Volumn 52, Issue 2, 1999, Pages 17-18
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Experiments and Simulations Track Crack Propagation in Silicon Wafers
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0004936808
PISSN: 00319228
EISSN: None
Source Type: Trade Journal
DOI: 10.1063/1.882518 Document Type: Article |
Times cited : (3)
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References (4)
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