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Volumn 216, Issue 1, 2000, Pages 413-427

Etching and surface termination of K2Cr2O7 {0 0 1} faces observed using in situ atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

AIR; ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; ETCHING; ETHANOL; LITHOGRAPHY; NUCLEATION; WATER;

EID: 0033717518     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00441-3     Document Type: Article
Times cited : (21)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.