(n, m) structural assignments and chirality dependence in single-wall carbon nanotube Raman scattering

Journal of Physical Chemistry B

Volumn 105, Issue 29, 2001, Pages 6831-6837

  Yu, Zhonghua ^a   Brus, Louis E ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHIRALITY;

ADSORPTION; ELECTRONIC STRUCTURE; FILTRATION; LASER BEAMS; OPTICAL MICROSCOPY; RAMAN SCATTERING; RESONANCE; SURFACE ACTIVE AGENTS;

CARBON NANOTUBES;

EID: 0035954967     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp010853t     Document Type: Article

References (41)

1. Dresselhaus, M.S.; Dresselhaus, G.; Eklund, P. C. Science of Fullerenes and Carbon Nanotubes; Academic Press: New York, 1996.
2. Saito, R; Dresselhaus, G.; Dresselhans, M. S. Physical Properties of Carbon Nanotubes; Imperial College Press: London, 1998.
3. Iijima, S.; Ichihashi, T. Nature 1993, 363, 603.
4. Bethune, D.S.; Chiang, C.H.; Vries, M.S.d.; Gorman, G.; Savoy, R.; Vazquez, J.; Beyers, R. Nature 1993, 363, 605.
5. Ran, A.M.; Richter, E.; Bandow, S.; Chase, B.; Eklund, P.C.; Williams, K.A.; Fang, S.; Subbaswamy, K.R.; Menon, M.; Thess, A.; Smalley, R.E.; Dresselhaus, G.; Dresselhaus, M. S. Science 1997, 275, 187.
6. Saito, R.; Takeya, T.; Kimura, T.; Dmsselhaus, G.; Dresselhaus, M. S. Phys. Rev. B 1998, 57, 4145.
7. Kataura, H.; Kumazawa, Y.; Maniwa, Y.; Umezu, I.; Suzuki, S.; Ohtsnka, Y.; Achiba, Y. Synth. Met. 1999, 103, 2555.
8. Jorio, A.; Dresselhaus, G.; Dresselhaus, M.S.; Souza, M.; Dantas, M.S.S.; Pimenta, M.A.; Ran, A.M.; Saito, R.; Liu, C.; Cheng, H. M. Phys. Rev. Lett. 2000, 85, 2617.
9. Brown, S.D.M.; Jorio, A.; Corio, P.; Dresselhaus, M.S.; Dresselhaus, G.; Saito, R.; Kneipp, K. Phys. Rev. B 2001, 63, 155414.
10. Saito, R.; Jorio, A.; Hafner, J.H.; Lieber, C.M.; Hunter, M.; McClure, T.; Gresselhaus, G.; Dressethaus, M. S. Phys. Rev. B, submitted for publication.
11. Richter, E.; Subbaswamy, K. R. Phys. Rev. Lett. 1997, 79, 2738.
12. Charlier, J.C.; Lambin, P. Phys. Rev. B 1998, 57, R15037.
13. Saito, R.; Dresselhans, G.; Dresselhaus, M. S. Phys. Rev. B 2000, 61, 2981.
14. Friedman, J.; Hochstraasser. R. M. Chem. Phys. Lett. 1975, 32, 414.
15. Mortensen, O.S.; Hassing, S. Polarization and Interference Phenomena in Resonance Raman Scattering. In Advances in Infrared and Raman Spectroscopy; Clark, R.J.H., Hester, R.E., Eds.; Heyden: London, 1980; Vol. 6.
16. Rao, A.M.; Bandow, S.; Richter, E.; Eklund, P.C. Thin Solid Films 1998, 331, 141.
17. Pimenta, M.A.; Marucci, A.; Brown, S.D.M.; Matthews, M.J.; Rao, A.M.; Eklund, P.C.; Smalley, R.E.; Dresselhaus, G.; Dresselhaus, M.S. J. Mater. Res. 1998, 13, 2396.
18. Yu, Z.; Brus, L.E. J. Phys. Chem. A 2000, 104, 10995.
19. Yu, Z.; Brus, L. J. Phys. Chem. B 2001, 105, 1123.
20. Duesberg, G.S.; Loa, I.; Burghard, M.; Syassen, K.; Roth, S. Phys. Rev. Lett. 2000, 85, 5436.
21. Jorio, A.; Saito, R.; Hafner, J.; Lieber, C.M.; Gresselhaus, G.; Dresselhaus, M.S. Phys. Rev. Lett. 2001, 86, 1118.
22. Rinzler, A.G.; Liu, J.; Dai, H.; Nikolaev, P.; Huffman, C.B.; Rodriguez-Macias, F.J.; Boul, P.J.; Lu, A.H.; Heymann, D.; Colbert, D.J.; Lee, R.S.; Fischer, J.E.; Rao, A.M.; Eklund, P.C.; Smalley, R.E. Appl. Phys. A 1998, 67, 29.
23. Duesberg, G.S.; Blau, W.J.; Byrne, H.J.; Muster, J.; Burghard, M.; Roth, S. Chem. Phys. Lett. 1999, 310, 8.
24. Thess, A.; Lee, R.; Nikolaev, P.; Dai, H.J.; Petit, P.; Robert, J.; Xu, C.H.; Lee, Y.H.; Kim, S.G.; Rinzier, A.G.; Colbert, D.T.; Scuseria, G.E.; Tomanek, D.; Fischer, J.E.; Smalley, R.E. Science 1996, 273, 483.
25. Tan, P.H.; Tang, Y.; Hu, C.Y.; Li, F.; Wei, Y.L.; Cheng, H. M. Phys. Rev. B 2000, 62, 5186.
26. Rafailov, P.M.; Jantoljak, H.; Thomsen, C. Phys. Rev. B 2000, 61, 16179.
27. Li, H.D.; Yue, K.T.; Lian, Z.L.; Zhan, Y.; Zhou, L.X.; Zhang, S.L.; Shi, Z.J.; Gu, Z.N.; Liu, B.B.; Yang, R.S.; Yang, H.B.; Zou, G.T.; Zhang, Y.; Iijima, S. Appl. Phys. Lett. 2000, 76, 2053.
28. Hayes, W.; London, R. The Scattering of Light by Crystals; John Wiley: New York, 1976.
29. Martin, R.M.; Falicov, L.M. Resonant Raman Scattering. In Light Scattering in Solids; Cardona, M., Ed.; Springer-Verlag: New York, 1975.
30. Mintmire, J.W.; White, C.T. Phys. Rev. Lett. 1998, 81, 2506.
31. The definition of the line width parameter used in ref 28 differs from ours by a factor of 2.
32. Pimenta, M.A.; Marucci, A.; Empedocles, S.A.; Bawendi, M.G.; Hanlon, E.B.; Rao, A.M.; Eklund, P.C.; Smalley, R.E.; Dresselhaus, G.; Dresselhaus, M.S. Phys. Rev. B 1998, 58, R16016.
33. Wildöer, J.W.G.; Venema, L.C.; Rinzler, A.G.; Smalley, R.E.; Dekker, C. Nature 1998, 391, 59.
34. Venkateswaran, U.D.; Rao, A.M.; Richter, E.; Menon, M.; Rinzler, A.; Smalley, R.E.; Eklund, P.C. Phys. Rev. B 1999, 59, 10928.
35. Kwon, Y.-K.; Saito, S.; Tománek, D. Phys. Rev. B 1998, 58, R13314.
36. Hertel, T.; Moos, G. Chem. Phys. Lett. 2000, 320, 359.
37. Alivisatos, A.P.; Harris, T.D.; Carroll, P.J.; Steigerwald, M.L.; Bras, L.E. J. Chem. Phys. 1989, 90, 3463.
38. Odom, T.W.; Huang, J.L.; Kim, P.; Lieber, C.M. J. Phys. Chem. B 2000, 104, 2794.
39. Kasuya, A.; Sasaki, Y.; Saito, Y.; Tohji, K.; Nishina, Y. Phys. Rev. Lett. 1997, 78, 4434.
40. Eklund, P.C.; Holden, J.M.; Jishi, R.A. Carbon 1995, 33, 959.
41. Brown, S.D.M.; Corio, P.; Marucci, A.; Dresselhaus, M.S.; Pimenta, M.A.; Kneipp, K. Phys. Rev. B 2000, 61, R5137.