SCOPUS 정보 검색 플랫폼

Volumn 283, Issue 1-3, 2000, Pages 256-261

ID01 beamline at the E.S.R.F.: The diffuse scattering technique applied to surface and interface studies

b CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE SCATTERING; RADIATION DETECTORS; X RAY ANALYSIS; X RAY SCATTERING;

SMALL-ANGLE X RAY SCATTERING (SAXS) ANALYSIS; UNDULATORS; WIDE-ANGLE X RAY SCATTERING (WAXS) ANALYSIS; WIGGLERS;

SYNCHROTRON RADIATION;

EID: 0033751847 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4526(99)01990-0 Document Type: Article

Times cited : (12)

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