Use of genetic algorithms for the simulationeous estimation thin films thermal conductivity and contact resistances

International Journal of Heat and Mass Transfer

Volumn 44, Issue 20, 2001, Pages 3973-3984

  Orain, S ^a   Scudeller, Y ^a   Garcia, S ^a   Brousse, T ^b  

^a Centre National de la Recherche Scientifique   (France)

^b UNIVERSITÉ DE NANTES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

GENETIC ALGORITHMS; TEMPERATURE MEASUREMENT; THERMAL CONDUCTIVITY;

PHOTO-THERMAL TECHNIQUES;

THIN FILMS;

FILM;

EID: 0035928834     PISSN: 00179310     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0017-9310(01)00025-4     Document Type: Article

References (12)

1. Traveling wave method for measurements of thermal conductivity of thin films
2. Measures thermiques microscopiques
3. Heat transport in thin dielectric films
4. Thermal conductivity of dielectric thin film
5. 2 thin films
6. Thermal interface resistance and subsurface effusivity of submicronic metallic films on dielectric substrates: An experimental method for simultaneous determination
7. Détermination expérimentale de la conductivité thermique et de la capacité calorifique de films diélectriques submicroniques
8. Use of genetic algorithms in thermal property estimation: Part II - Simultaneous estimation of thermal properties