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Applied Physics Letters

Volumn 78, Issue 22, 2001, Pages 3439-3441

Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe

(4) Schleiwies, J a Schmitz, G a Heitmann, S b Hutten A b

a UNIVERSITY OF GÖTTINGEN (Germany)

b BIELEFELD UNIVERSITY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035926894 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1374999 Document Type: Article

Times cited : (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.