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Volumn 32, Issue 5 PART 2, 1996, Pages 4579-4581
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Magnetoresistance and morphology in magnetic multilayers by insertion of very thin Fe, Co layers
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COBALT;
ELECTROMAGNETIC WAVE SCATTERING;
FILM GROWTH;
INTERFACES (MATERIALS);
IRON;
MAGNETIC COUPLINGS;
MAGNETIC FILMS;
MAGNETORESISTANCE;
MORPHOLOGY;
THICKNESS MEASUREMENT;
X RAY DIFFRACTION ANALYSIS;
CLUSTERED OUT GROWTH;
INTERLAYER ANTIFERROMAGNETIC COUPLING;
MAGNETIC MULTILAYERS;
SPIN DEPENDENT SCATTERING PHENOMENA;
SURFACE MORPHOLOGY;
MULTILAYERS;
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EID: 0030246051
PISSN: 00189464
EISSN: None
Source Type: Journal
DOI: 10.1109/20.539085 Document Type: Article |
Times cited : (5)
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References (5)
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