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Volumn 487, Issue 1-3, 2001, Pages 97-106
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Structure of the clean NiAl(1 1 0) surface and the Al2O3/NiAl(1 1 0) interface by measurements of crystal truncation rods
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Author keywords
Alloys; Insulating films; Surface structure, morphology, roughness, and topography; X ray scattering, diffraction, and reflection
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Indexed keywords
ALUMINA;
INSULATING MATERIALS;
INTERFACES (MATERIALS);
MORPHOLOGY;
NICKEL ALLOYS;
SUBSTRATES;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
X RAY CRYSTALLOGRAPHY;
CRYSTAL TRUNCATION RODS;
SURFACE CHEMISTRY;
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EID: 0035919853
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)01078-0 Document Type: Article |
Times cited : (37)
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References (41)
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