Transmission electron microscopic investigation of an ordered Al2O3 film on NiAl(110)

Surface Science

Volumn 385, Issue 1, 1997, Pages 66-76

  Klimenkov, M ^a   Nepijko, S ^b   Kuhlenbeck, H ^b   Freund, H J ^a,b  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

Aluminum oxide; Electron microscopy; Epitaxy; Moir pattern

Indexed keywords

CRYSTAL ORIENTATION; EPITAXIAL GROWTH; LATTICE CONSTANTS; NICKEL COMPOUNDS; OXIDATION; SURFACE STRUCTURE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VACUUM;

MOIRE PATTERN;

ALUMINA;

EID: 0031212892     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00150-7     Document Type: Article

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