Correlation of Nanowear Patterns to Viscoelastic Response in a Thin Polystyrene Melt

Langmuir

Volumn 15, Issue 2, 1999, Pages 317-321

  Schmidt, Ronald H ^a   Haugstad, Greg ^b   Gladfelter, Wayne L ^a  

^a University of Minnesota   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GLASS TRANSITION; MICROSCOPIC EXAMINATION; MOLTEN MATERIALS; POLYSTYRENES; THERMAL EFFECTS; THIN FILMS; VISCOELASTICITY;

SCANNING FORCE MICROSCOPY; WILLIAMS-LANDEL-FERRY (WLF) EQUATION;

PLASTIC FILMS;

EID: 0032804172     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980739a     Document Type: Article

References (21)

1. Bhushan, B. Handbook of Micro/Nanotribology; CRC Press: Boca Raton, FL, 1995.
2. Mate, C. M. Phys. Rev. Lett. 1992, 68, 3323-3326.
3. Israelachvili, J. N. Surf. Sci. Rep. 1992, 14, 109-159.
4. Drake, J. M.; Klafter, J.; Kopelman, R. Dynamics in Small Confining Systems III; Materials Research Society: Warrendale, PA, 1996; Vol. 464.
5. Langmuir (Special Issue: Proceedings of a Workshop on the Physical and Chemical Mechanisms of Tribology) 1996, 12, 4482-4582.
6. Tant, M. R.; Wilkes, G. L. Polym. Eng. Sci. 1981, 21, 874-895.
7. Matsuoka, S. Polym. Eng. Sci. 1981, 21, 907-921.
8. Leung, O. M.; Goh, M. C. Science 1992, 255, 64-67.
9. Lea, S. S.; Pungor, A.; Hlady, V.; Andrade, J. D.; Herron, J. N.; Voss, E. W. Langmuir 1992, 8, 68-73.
10. Meyers, G. F.; DeKoven, B. M.; Seitz, J. T. Langmuir 1992, 8, 2330-2335.
11. Elkaakour, Z.; Aime, J. P.: Bouhacina, T.; Odin, C.; Masuda, T. Phys. Rev. Lett. 1994, 73, 3231-3234.
12. Jing, J.; Henriksen, P. N.; Wang, H.; Marteny, P. J. Mater. Sci. 1995, 30, 5700-5704.
13. The tip's velocity is calculated from the following equation: 2 × (fast-scan frequency) × (image size). The fast-scan frequency refers to how many trace-retrace cycles (refer to Figure 2) are performed per second.
14. This cantilever was chosen for its tip sharpness, its high reflectivity, and its stiffness. We found that the thermal strain (i.e., bending of the cantilever due to the mismatch in the thermal expansivity of silicon and the metal coating) was very small in comparison with other commercially available cantilevers.
15. For more information regarding the SFM design, refer to US Patent 5675154 Oct. 7, 1997.
16. Digital Instruments. Nanoscope III Control Systems User's Manual, Version 3.0. 1993.
17. Ferry, J. D. Viscoelastic Properties of Polymers; Wiley & Sons: New York, 1980.
18. Keddie, J. L.; Jones, R. A. L.; Cory, R. A. Europhys. Lett. 1994, 27, 59-64.
19. Forrest, J. A.; Dalnoki-Veress, K.; Stevens, J. R.; Dutcher, J. R. Phys. Rev. Lett. 1996, 77, 2002-2005.
20. Forrest, J. A.; Dalnoki-Veress, K.; Dutcher, J. R. Phys. Rev. E. 1997, 56, 5705-5716.
21. Stevens, J. R.; Coakley, R. W.; Chau, K. W.; Hunt, J. L. J. Chem. Phys. 1985, 84, 1006-1014.