Applied surface analysis in magnetic storage technology

Applied Surface Science

Volumn 179, Issue 1-4, 2001, Pages 167-180

  Windeln, Johannes ^a   Bram, Christian ^a   Eckes, Heinz Ludwig ^a   Hammel, Dirk ^a   Huth, Johanna ^a   Marien, Jan ^a   Röhl, Holger ^a   Schug, Christoph ^a   Wahl, Michael ^a   Wienss, Andreas ^a  

^a IBM   (Germany)

Author keywords

Carbon overcoat hardness; Electron beam; Electron spectroscopy; Focused ion beam; Magnetic force microscopy; Magnetic recording; Raman spectroscopy; ToF SIMS; X ray analysis

Indexed keywords

ELECTRON BEAMS; GIANT MAGNETORESISTANCE; ION BEAMS; MAGNETIC RECORDING; RAMAN SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SENSORS;

FOCUSED ION BEAMS;

MAGNETIC STORAGE;

EID: 0035898798     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00277-X     Document Type: Article

References (21)