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Volumn 174, Issue 2, 2001, Pages 148-154
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Surface morphology and chemical states of highly oriented PbZrO 3 thin films prepared by a sol-gel process
a
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Author keywords
Atomic force microscopy; Chemical composition; Nucleation; PbZrO 3 thin films; Surface morphology; X ray photoelectron spectroscopy
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTAL ORIENTATION;
FILM GROWTH;
FILM PREPARATION;
LEAD COMPOUNDS;
MORPHOLOGY;
NUCLEATION;
SCANNING ELECTRON MICROSCOPY;
SOL-GELS;
SOLID SOLUTIONS;
SUBSTRATES;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
CHEMICAL COMPOSITION;
SURFACE CHEMISTRY;
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EID: 0035897229
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(01)00027-7 Document Type: Article |
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Times cited : (22)
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References (18)
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