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Volumn 64, Issue 8, 2001, Pages

Model of a switching oxide trap in amorphous silicon dioxide

Author keywords

[No Author keywords available]

Indexed keywords

OXIDE; SILICON DIOXIDE;

EID: 0035880977     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.081310     Document Type: Article
Times cited : (16)

References (21)
  • 8
    • 85038313766 scopus 로고    scopus 로고
    • A. H. Edwards, W. B. Fowler, and J. Robertson, in, edited by R. A. B. Devine, J-P. Duraud, and E. Dooryhée (John Wiley & Sons, Chichester, 2000), p. 253 and references therein
    • A. H. Edwards, W. B. Fowler, and J. Robertson, in Structure and Imperfections in Amorphous and Crystalline Silicon Dioxide, edited by R. A. B. Devine, J-P. Duraud, and E. Dooryhée (John Wiley & Sons, Chichester, 2000), p. 253 and references therein.
  • 16
    • 85022583881 scopus 로고
    • and references therein
    • M S. Gordon, Chem. Phys. Lett.76, 163 (1980), and references therein.
    • (1980) Chem. Phys. Lett. , vol.76 , pp. 163
    • Gordon, M.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.